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Wrinkle-Based Measurement of Elastic Modulus of Nano-Scale Thin Pt Film Deposited on Polymeric Substrate: Verification and Uncertainty Analysis

✍ Scribed by H-J. Choi; J-H. Kim; H-J. Lee; S-A. Song; H-J. Lee; J-H. Han; M-W. Moon


Publisher
Sage Publications
Year
2009
Tongue
English
Weight
298 KB
Volume
50
Category
Article
ISSN
0014-4851

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