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Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave—Part I: Modeling and Algorithm

✍ Scribed by Lagos, J.L.; Fiori, F.


Book ID
114624925
Publisher
IEEE
Year
2011
Tongue
English
Weight
581 KB
Volume
53
Category
Article
ISSN
0018-9375

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