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Worst-Case Analysis of a Resistor Memory Matrix

โœ Scribed by Lynch, W.T.


Book ID
114587465
Publisher
IEEE
Year
1969
Tongue
English
Weight
505 KB
Volume
C-18
Category
Article
ISSN
0018-9340

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Worst-case identification of nonlinear f
โœ Munther A. Dahleh; Eduardo D. Sontag; David N.C. Tse; John N. Tsitsiklis ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 786 KB

In this paper, the problem of asymptotic identification for fading memory systems in the presence of bounded noise is studied. For any experiment, the worst-case error is characterized in terms of the diameter of the worst-case uncertainty set. Optimal inputs that minimize the radius of uncertainty