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Wire-bond failures induced by resonant vibrations in the CDF silicon detector

✍ Scribed by G. Bolla; M. Atac; V. Pavlicek; S. Nahn; M. Garcia-Sciveres; R. Mumford; T. Nguyen; S. Forrester; C. Hill; J. Olszewski; A. Rahaman; J. Goldstein; B. Ashmanskas; T. Maruyama; T. Zimmerman; S. Moccia; J. Lewis


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
242 KB
Volume
518
Category
Article
ISSN
0168-9002

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