✦ LIBER ✦
Width dependence of electromigration life in Al-Cu, Al-Cu-Si and Ag conductors : G. A. Scoggan, B. N. Agarwala, P. P. Peressini, and A. Brouillard. 13th Ann. Proc. Reliability Physics Symp., Nevada. 1975. p. 151
- Book ID
- 103269532
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 127 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0026-2714
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