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Widely extended new method for measuring the impedance (CxRx) at high frequencies with applications

✍ Scribed by Ichijo, B.; Masuda, Y.; Tarao, N.; Sada, M.

Book ID: 114542581
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 469 KB
Volume: 38
Category: Article
ISSN: 0018-9456
DOI: 10.1109/19.20000

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