Wide field X-ray monitor on board the High Energy Transient Experiment (HETE)

✍ Scribed by A. Yoshida; M. Matsuoka; N. Kawai; F. Tokanai; E. E. Fenimore; J. J. M. In 'T Zand; M. Galassi; M. Yamauchi; K. Takagishi; I. Hatsukade

• Book ID: 104869020
• Publisher: Springer Netherlands
• Year: 1995
• Tongue: English
• Weight: 235 KB
• Volume: 231
• Category: Article
• ISSN: 0004-640X
• DOI: 10.1007/bf00658671