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Wide-band characterization of multilayer thick film structures using a time-domain technique

โœ Scribed by Toscano, J.C.; Elshabini-Riad, A.; Riad, S.M.; Al-Mazroo, A.Y.


Book ID
114542466
Publisher
IEEE
Year
1989
Tongue
English
Weight
474 KB
Volume
38
Category
Article
ISSN
0018-9456

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