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Whole diffraction pattern-fitting of polycrystalline fcc materials based on microstructure

✍ Scribed by P. Scardi; M. Leoni; Y.H. Dong

Book ID: 106260105
Publisher: Springer
Year: 2000
Tongue: English
Weight: 800 KB
Volume: 18
Category: Article
ISSN: 1434-6036
DOI: 10.1007/s100510070073

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