White-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure

✍ Scribed by P. Hlubina; J. Luňáček; D. Ciprian

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 503 KB
• Volume: 283
• Category: Article
• ISSN: 0030-4018
• DOI: 10.1016/j.optcom.2010.07.038