Weibull distribution used to set up inspection card for an asymmetrical sample: S. Zadvat and H. Daniel. Proc. CNET Conference on Reliability and Maintainability, Tregastel, France, p. 283 (8–12 September 1980). (In French)

• Book ID: 107829299
• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 120 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90317-6