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Weak-beam electron microscopy of nearly transverse grain boundaries

✍ Scribed by Schapink, F. W.


Publisher
John Wiley and Sons
Year
1976
Tongue
English
Weight
159 KB
Volume
38
Category
Article
ISSN
0031-8965

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High resolution electron microscopy and analytical electron microscopy have been carried out on grain boundaries in polycrystalline YBa2Cu307\_ ~ and LaCaBaCu307\_ ~, both with randomly orientated grains. Grain boundaries in YBa2Cu307\_~ are mostly parallel to the (001) plane of one of the adjacent