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Wavelet transform with spectral post-processing for enhanced feature extraction [machine condition monitoring]

✍ Scribed by Changting Wang; Gao, R.X.

Book ID: 114629391
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 413 KB
Volume: 52
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2003.816807

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