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Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT

✍ Scribed by Tian, G.Y.; Sophian, A.; Taylor, D.; Rudlin, J.


Book ID
114457306
Publisher
The Institution of Electrical Engineers
Year
2005
Tongue
English
Weight
195 KB
Volume
152
Category
Article
ISSN
1350-2344

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