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Wavelength-tracked white light interferometry for highly sensitive strain and temperature measurements

✍ Scribed by Bhatia, V.; Sen, M.B.; Murphy, K.A.; Claus, R.O.

Book ID
120008341
Publisher
The Institution of Electrical Engineers
Year
1996
Tongue
English
Weight
416 KB
Volume
32
Category
Article
ISSN
0013-5194

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