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Wavelength-Dispersive Total-Reflection X-ray Fluorescence with an Efficient Johansson Spectrometer and an Undulator X-ray Source: Detection of 10-16 g-Level Trace Metals

✍ Scribed by Sakurai, Kenji; Eba, Hiromi; Inoue, Katsuaki; Yagi, Naoto


Book ID
115449017
Publisher
American Chemical Society
Year
2002
Tongue
English
Weight
149 KB
Volume
74
Category
Article
ISSN
0003-2700

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