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Wavelength-dispersion analysis of pixe spectra

โœ Scribed by R.D. Willis; R.L. Walter; B.L. Doyle; S.M. Shafroth


Publisher
Elsevier Science
Year
1977
Weight
400 KB
Volume
142
Category
Article
ISSN
0029-554X

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The method of proton-induced X-ray emission (PIXE) was first utilized to analyze the elements in silk. Different kinds of silk from home and the wild were examined. The results show that every silk, besides C, H, O, and N, contains many types of elements such as Si, P, S, Ca, Mn, Fe, Cu, Zn, and Sr

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For non-destructive depth profiling by techniques such as PIXE, the effective depth of analysis can be reduced by employing a grazing angle between the incident analysing probe and the sample surface. However, for any given angle of incidence the data obtained is averaged over the depth of penetrati