𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Wavelength-demultiplexed fiber-optic temperature-measurement instrument

✍ Scribed by A. Andreev; G. Diankov; B. Zafirova; A. Kebedjiev

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
294 KB
Volume
30
Category
Article
ISSN
0924-4247

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Optical substrate thickness measurement
Optical substrate thickness measurement system using hybrid fiber-freespace optics and selective wavelength interferometry
✍ Nabeel A. Riza; Mumtaz Sheikh; Frank Perez πŸ“‚ Article πŸ“… 2007 πŸ› Elsevier Science 🌐 English βš– 594 KB

Proposed and demonstrated is a simple few components non-contact thickness measurement system for optical quality semi-transparent samples such as Silicon (Si) and 6H Silicon Carbide (SiC) optical chips used for designing sensors. The instrument exploits a hybrid fiber-freespace optical design that