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Waveguide measuring methods for the complex dielectric constant of semiconductors at shf

✍ Scribed by Yu. G. Arapov; A. B. Davydov

Publisher
Springer US
Year
1978
Tongue
English
Weight
266 KB
Volume
21
Category
Article
ISSN
0543-1972

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Application of the FDTD method to determ
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## Abstract A new measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a short‐circuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyzer and calculated as a function o