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Waveguide-fed longitudinal slot array antennas: Fault diagnosis using measurements of input impedance

✍ Scribed by J. A. Rodríguez; F. Ares; E. Moreno


Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
80 KB
Volume
32
Category
Article
ISSN
0895-2477

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✦ Synopsis


Abstract

This communication presents a method of locating defective elements of longitudinal broadwall slot array antennas. The method assumes defects to consist of partial obturation of the slots, and is based on measurement of the input impedance of the antenna. A genetic optimization algorithm finds the configuration of defective elements that best corresponds to the measured impedance. © 2002 John Wiley & Sons, Inc. Microwave Opt Technol Lett 32: 200–201, 2002.