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Water diffusion coefficient measurements in deposited silica coatings by the substrate curvature method

✍ Scribed by Jeremy Thurn


Book ID
116671502
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
304 KB
Volume
354
Category
Article
ISSN
0022-3093

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Among the various analysis modes which can be used in FTIR spectroscopy, the internal reflection mode enables us to gain near-surface information on solids or liquids. The interaction between the evanescent field created upon internal reflection of the infrared beam and a sample can be used to monit