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Wall-shear-stress and near-wall turbulence measurements up to single pixel resolution by means of long-distance micro-PIV

✍ Scribed by C. J. Kähler; U. Scholz; J. Ortmanns


Publisher
Springer
Year
2006
Tongue
English
Weight
768 KB
Volume
41
Category
Article
ISSN
0723-4864

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