✦ LIBER ✦

Wafer thickness optimization for silicon solar cells of heterogeneous material quality

✍ Scribed by Michl, Bernhard; Kasemann, Martin; Warta, Wilhelm; Schubert, Martin C.

Book ID: 124075359
Publisher: John Wiley and Sons
Year: 2013
Tongue: English
Weight: 430 KB
Volume: 7
Category: Article
ISSN: 1862-6254
DOI: 10.1002/pssr.201308090

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Optimization of substrate thickness for

Optimization of substrate thickness for interdigitated back contact silicon solar cells

✍ P. Verlinden; F. Van de Wiele 📂 Article 📅 1983 🏛 Elsevier Science ⚖ 415 KB

Lifetime measurements in solar cells of

Lifetime measurements in solar cells of various thicknesses and the related silicon wafers

✍ Raymond Van Steenwinkel; Maria Cristina Carotta; Giuliano Martinelli; Marco Merl 📂 Article 📅 1990 🏛 Elsevier Science ⚖ 281 KB

Surface characterisation of wafers for s

Surface characterisation of wafers for silicon-heterojunction solar cells

✍ R. Barrio; C. Maffiotte; J.J. Gandía; J. Cárabe 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 346 KB

Optimizing the Front Electrode of Silico

Optimizing the Front Electrode of Silicon-Wafer-Based Solar Cells and Modules

✍ Khoo, Yong Sheng; Walsh, Timothy M.; Aberle, Armin G. 📂 Article 📅 2013 🏛 Institute of Electrical and Electronics Engineers 🌐 English ⚖ 627 KB

Line-Imaging Spectroscopy for Characteri

Line-Imaging Spectroscopy for Characterisation of Silicon Wafer Solar Cells

✍ Matthew P. Peloso; Jen Sern Lew; Bram Hoex; Armin G. Aberle 📂 Article 📅 2012 🏛 Elsevier ⚖ 483 KB

Optimization of antireflection coating t

Optimization of antireflection coating thickness for textured polycrystalline silicon solar cells — an experimental study

✍ B.L. Sopori 📂 Article 📅 1990 🏛 Elsevier Science ⚖ 409 KB

Experimental results showing dependence of short-circuit current density J~ on the thickness of an antireflection (AR) film are given for two types of textured polycrystalline silicon solar cells. Results which identify changes in Jsc caused by encapsulation are also given for different AR film thic