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Wafer curvature, temperature inhomogeneity, plastic deformation and their impact on the properties of GaN on silicon power and opto-electronic structures

✍ Scribed by Schulz, Oliver; Dadgar, Armin; Hennig, Jonas; Krumm, Oliver; Fritze, Stephanie; Bläsing, Jürgen; Witte, Hartmut; Diez, Annette; Krost, Alois


Book ID
121871477
Publisher
John Wiley and Sons
Year
2014
Tongue
English
Weight
365 KB
Volume
11
Category
Article
ISSN
1862-6351

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