Voltage-testing of thin-film capacitors : T. M. Berlicki. IEEE Trans. Reliab. R-33, 205 (1984)

• Book ID: 103278569
• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 136 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90494-9