Voltage-temperature charge verification testing of 34 ampere hour nickel-cadmium cells
✍ Scribed by Paul J. Timmerman; Donald W. Bondeson
- Book ID
- 103898190
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 639 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0378-7753
No coin nor oath required. For personal study only.
✦ Synopsis
A test program was designed to evaluate various voltage-temperature (V-T) charge curves for use m low-earth-orbit (LEO) apphcations of nickelcadmium battery cells. The trends established relating V-T level to utihnable capacity were unexpected The trends toward lower capacity at higher V-T levels were predominant m this testmg. This effect was a function of the V-T level, the temperature, and the cell history. This effect was attributed to changes occurrmg m the positive plate The results unply that for some applications, the use of even lower V-T levels may be warranted. The need to limit overcharge, especially m the early phases of missions, is underlined by this test program