✦ LIBER ✦
Voltage stress effect on class AB power amplifier and mixed-signal sample-hold circuit
✍ Scribed by J.S. Yuan; J. Ma
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 442 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.
✦ Synopsis
The effects of gate and drain voltage stress and breakdown location on the class AB power amplifier and mixed-signal sample-hold circuit have been studied. The soft breakdown has minor effect on the performance of the power amplifier and sample-hold circuit, while the hard breakdown at the drain side reduces the power efficiency of the class AB power amplifier and degrades the signal to noise ratio of the sample-hold circuit significantly. Also, hot electron effect reduces the linearity of the class AB power amplifier.