Voltage-dependence of magnetoresistance in ferromagnetic tunneling junctions: a rigorous free electron model study

✍ Scribed by S.S Liu; G.Y Guo

• Book ID: 114230474
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 86 KB
• Volume: 209
• Category: Article
• ISSN: 0304-8853
• DOI: 10.1016/s0304-8853(99)00667-8