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Voltage- and temperature-dependent gate capacitance and current model: application to ZrO2 n-channel MOS capacitor

✍ Scribed by Yang-Yu Fan; Nieh, R.E.; Lee, J.C.; Lucovsky, G.; Brown, G.A.; Register, L.F.; Banerjee, S.K.


Book ID
114616890
Publisher
IEEE
Year
2002
Tongue
English
Weight
510 KB
Volume
49
Category
Article
ISSN
0018-9383

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