VLSI testing : digital and mixed analogue/digital techniques

✍ Scribed by Hurst, Stanley Leonard

Publisher: Institution of Electrical Engineers
Year: 1998
Tongue: English
Leaves: 554
Series: IEE circuits and systems series 9
Edition: 1
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

A comprehensive introduction and reference for all aspects of IC testing, this book includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing

✦ Table of Contents

Content: * Chapter 1: Introduction * Chapter 2: Faults in digital circuits * Chapter 3: Digital test pattern generation * Chapter 4: Signatures and self test * Chapter 5: Structured design for testability (DFT) techniques * Chapter 6: Testing of structured digital circuits and microprocessors * Chapter 7: Analogue testing * Chapter 8: Mixed analogue/digital system test * Chapter 9: The economics of test and final overall summary * Appendices

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