Lsi/Vlsi Testability Design
โ Frank F. Tsui
๐ Library
๐
1987
๐ Mcgraw-Hill (Tx)
๐ English
โฆ LIBER โฆ
๐
VLSI Memory Chip Design
โ Scribed by Dr. Kiyoo Itoh (auth.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Year
- 2001
- Tongue
- English
- Leaves
- 503
- Series
- Springer Series in Advanced Microelectronics 5
- Edition
- 1
- Category
- Library
โฌ Acquire This Volume
No coin nor oath required. For personal study only.
โฆ Synopsis
This book features a systematic description of microelectronic device design ranging from the basics to current topics, such as low-power/ultralow-voltage designs including subthreshold current reduction, memory subsystem designs for modern DRAMs and various on-chip supply-voltage conversion techniques. It also covers process and device issues as well as design issues relating to systems, circuits, devices and processes, such as signal-to-noise and redundancy.
โฆ Table of Contents
Front Matter....Pages I-XI
An Introduction to Memory Chip Design....Pages 1-48
The Basics of RAM Design and Technology....Pages 49-96
DRAM Circuits....Pages 97-194
High Signal-to-Noise Ratio DRAM Design and Technology....Pages 195-248
On-Chip Voltage Generators....Pages 249-337
High-Performance Subsystem Memories....Pages 339-387
Low-Power Memory Circuits....Pages 389-423
Ultra-Low-Voltage Memory Circuits....Pages 425-472
Back Matter....Pages 473-495
โฆ Subjects
Optical and Electronic Materials; Electronics and Microelectronics, Instrumentation; Nanotechnology; Engineering, general
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