✦ LIBER ✦

VLSI design automation: an introduction : Michael Feuer. Proc. IEEE71 (1), 5 (1983)

Book ID: 107829510
Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 108 KB
Volume: 23
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(83)90856-9

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Managing VLSI complexity: an outlook: Ca

Managing VLSI complexity: an outlook: Carlo H. Sequin Proc. IEEE 71 (1), 149 (1983)

📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 96 KB

Managing VLSI complexity: an outlook : C

Managing VLSI complexity: an outlook : Carlo H. Sequin. Proc. IEEE71 (1), 149 (1983)

📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 127 KB

Hierarchical design methodologies and to

Hierarchical design methodologies and tools for VLSI chips : C. Niessen. Proc. IEEE71 (1), 66 (1983)

📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 125 KB

On the design of algorithms for VLSI sys

On the design of algorithms for VLSI systolic arrays : Dan I. Moldovan. Proc. IEEE71 (1), 113 (1983)

📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 129 KB

Wire-routing machines—new tools for VLSI

Wire-routing machines—new tools for VLSI physical design: Se June Hong and Ravinair Proc. IEEE 71 (1), 57 (1983)

📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 96 KB

Circuit analysis, logic simulation and d

Circuit analysis, logic simulation and design verfication for VLSI: Alberte. Ruehi and Garys. Ditlow Proc. IEEE 71 (1(, 34 (1983)

📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 102 KB

The use of high om.~gnetic fields for the characterization of impurities in epitaxiai GaAs M. N AFSAR Microelectron. J. 13 (1), 15 (1982) The only reliable method for indentification of donor contaminants such as Si, S, Si, Sn and Ge in ultra-high purity epitaxial GaAs is the observation of the 1 s