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Visualization of submonolayers and surface topography by biassed secondary electron imaging: Application to Ag layers on Si and W surfaces

✍ Scribed by M. Futamoto; M. Hanbücken; C.J. Harland; G.W. Jones; J.A. Venables


Publisher
Elsevier Science
Year
1985
Weight
49 KB
Volume
150
Category
Article
ISSN
0167-2584

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