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Visual field defects in acute optic neuritis - distribution of different types of defect pattern, assessed with threshold-related supraliminal perimetry, ensuring high spatial resolution

✍ Scribed by J. Nevalainen; E. Krapp; J. Paetzold; I. Mildenberger; D. Besch; R. Vonthein; J. L. Keltner; C. A. Johnson; U. Schiefer


Book ID
106097826
Publisher
Springer-Verlag
Year
2008
Tongue
English
Weight
522 KB
Volume
246
Category
Article
ISSN
0065-6100

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