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Virtual Voltage Method for Analyzing Shielding Current Density in High-Temperature Superconducting Film With Cracks/Holes

โœ Scribed by Kamitani, Atsushi; Takayama, Teruou; Ikuno, Soichiro


Book ID
121477573
Publisher
IEEE
Year
2013
Tongue
English
Weight
936 KB
Volume
49
Category
Article
ISSN
0018-9464

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