Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits

✍ Scribed by Wangyang Zhang; Xin Li; Liu, F.; Acar, E.; Rutenbar, R.A.; Blanton, R.D.

• Book ID: 114607629
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 932 KB
• Volume: 30
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2011.2164536