VIB-6 Hall effect analysis of charge transport in silicon dioxide-silicon nitride double layers

✍ Scribed by Hiraiwa, A.; Yugami, J.; Ihjima, S.; Kusaka, T.; Ohji, Y.

• Book ID: 114596204
• Publisher: IEEE
• Year: 1987
• Tongue: English
• Weight: 161 KB
• Volume: 34
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1987.23321