✦ LIBER ✦
VIB-3 accurate analysis of impact ionization effects in submicrometer MOSFET devices
✍ Scribed by Hwang, C.C.; Dutton, R.W.; Higman, J.M.; Hess, K.
- Book ID
- 114596202
- Publisher
- IEEE
- Year
- 1987
- Tongue
- English
- Weight
- 169 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0018-9383
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