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Vertical-Gate Si/SiGe Double-HBT-Based Capacitorless 1T DRAM Cell for Extended Retention Time at Low Latch Voltage

✍ Scribed by Ja Sun Shin; Hyunjun Choi; Hagyoul Bae; Jaeman Jang; Daeyoun Yun; Euiyoun Hong; Dae Hwan Kim; Dong Myong Kim


Book ID
119799641
Publisher
IEEE
Year
2012
Tongue
English
Weight
431 KB
Volume
33
Category
Article
ISSN
0741-3106

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