Variations of temperature coefficient and noise in thin Al and Al/Si resistors subjected to high current density

✍ Scribed by A. Diligenti; B. Neri; A. Nannini; S. Ciucci

• Book ID: 112819989
• Publisher: Springer US
• Year: 1991
• Tongue: English
• Weight: 826 KB
• Volume: 20
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/bf02666018