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Variation tolerant on-chip degradation sensors for dynamic reliability management systems

✍ Scribed by Y. Wang; M. Enachescu; S.D. Cotofana; L. Fang

Book ID: 119326687
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 835 KB
Volume: 52
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2012.06.038

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