✦ LIBER ✦
Variation of yield with thickness in SIMS and PDMS : measurements of secondary ion emission from organized molecular films: G Bolbach et al, Nucl Instrum Meth Phys Res, B30, 1988, 74–82
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 157 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0042-207X
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