Variation of the reflection coefficient of semiconductors in a wavelength range from 0.2 to 20 μm under the action of ultrasonic waves

✍ Scribed by B. N. Zaveryukhin; N. N. Zaveryukhina; O. M. Tursunkulov

• Book ID: 110132503
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2002
• Tongue: English
• Weight: 79 KB
• Volume: 28
• Category: Article
• ISSN: 1063-7850
• DOI: 10.1134/1.1511774