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Variation of secondary electron yield in the fractured surface of melt-textured growth YBCO superconductor with Y2BaCu05grains under a scanning electron microscope in the temperature range 81–300 K

✍ Scribed by J. C. L. Chow; P. C. W. Fung


Publisher
Springer
Year
1995
Tongue
English
Weight
609 KB
Volume
14
Category
Article
ISSN
0261-8028

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