✦ LIBER ✦
Variation of nitrogen incorporation and bonding configuration of carbon nitride films studied by X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared (FT-IR) spectroscopic ellipsometry
✍ Scribed by Kennou, S.; Logothetidis, S.; Sygellou, L.; Laskarakis, A.; Sotiropoulou, D.; Panayiotatos, Y.
- Book ID
- 121984807
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 134 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0925-9635
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