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Variation of energy gap and resistivity minimum position with thickness in bismuth thin films

โœ Scribed by Das, V. Damodara ;Vaidehi, S.


Publisher
John Wiley and Sons
Year
1982
Tongue
English
Weight
420 KB
Volume
71
Category
Article
ISSN
0031-8965

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Oscillatory behaviour of resistivity wit
โœ V Damodara Das; N Jayaprakash ๐Ÿ“‚ Article ๐Ÿ“… 1981 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 338 KB

Bismuth thin films of various thicknesses in the range 150-3500 d[ have been vacuum deposited on clean glass substrates held at room temperature. Resistances were measured both before and after heat treatment in situ, which was carried opt immediately after film formation. It is found that the resis