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Variation of crystal quality and residual stresses in epitaxially grown thin film systems induced by ion implantation and annealing

✍ Scribed by Liu, Mei; Ruan, Haihui; Zhang, Liangchi


Book ID
120393643
Publisher
Cambridge University Press
Year
2013
Tongue
English
Weight
527 KB
Volume
28
Category
Article
ISSN
0884-2914

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