✦ LIBER ✦
Variation in emitter diffusion depth by TiSi2 formation on polysilicon emitters of Si bipolar transistors
✍ Scribed by Kondo, M.; Shimamoto, H.; Washio, K.
- Book ID
- 114538838
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 241 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.