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Variable temperature Raman microscopy as a nanometrology tool for graphene layers and graphene-based devices

✍ Scribed by Calizo, I.; Miao, F.; Bao, W.; Lau, C. N.; Balandin, A. A.


Book ID
118043186
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
441 KB
Volume
91
Category
Article
ISSN
0003-6951

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