An atomic force microscope (AFM) operating in tapping or contact mode was used to study the surface topography and the molecular organization of Vectra-A and Vectra-B films. Large-scale (15 Ο« 15 m) AFM images revealed that ribbonlike fibrils with a width/height Σ· 1.0 are the dominant surface feature
Variable-Temperature Atomic Force Microscopy : Applications to Studies of Semicrystalline Polymers
β Scribed by Dimitri A. Ivanov
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 2006
- Weight
- 247 KB
- Volume
- 8
- Category
- Article
- ISSN
- 1439-4243
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